| CeO₂ / TREO chemistry | Defines oxide chemistry and rare-earth composition, but does not alone predict removal rate or finish. | Chemical assay / ICP or supplier method | What are CeO₂, TREO and key impurity levels? |
| D50 + upper particle tail | Median size affects contact scale; oversize particles and agglomerates can dominate scratch risk. | Laser diffraction / particle-size analysis | What are D50, D90/D97 and the controlled upper tail? |
| Crystallinity / crystal planes | Recent optical-glass work links crystallinity and exposed structure, especially the (111) plane, to polishing performance. | XRD | How consistent is calcination and crystal development between lots? |
| Ce³⁺ / Ce⁴⁺ surface state | Ce³⁺-related surface chemistry can strengthen Ce–O–Si interactions with silica. | XPS / research characterization | Is the grade optimized for chemical activity on silica? |
| Morphology / agglomeration | Particle geometry changes contact mechanics; hard agglomerates can create defects. | SEM / microscopy / dispersion testing | Is the powder easily dispersed and screened for hard oversize? |
| Slurry pH / solids | Affects dispersion, surface charge, transport and process stability. | pH meter / solids analysis | What dilution range and solids loading are recommended? |
| Dispersion stability | Settling and re-agglomeration change the delivered particle population at the polishing interface. | Settling / viscosity / zeta-potential studies | Powder, concentrate or stabilized suspension? |
| Polishing result | The process is judged by removal rate, haze, roughness, scratches and cleaning behavior. | Application trial | Can you recommend a trial matrix for our glass, pad and machine? |